A Simple, Model Based Approach for Robust Quantification of EELS Spectra and Spectrum-Images

Microscopy and Microanalysis

Volumn 18, Issue , 2012, Pages 968-969

  Thomas, P J ^a   Twesten, R D ^a  

^a GATAN INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85007943250     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612006691     Document Type: Article

References (4)

1. J. Scott et al, Ultramicroscopy 108 (2008) 1586.
2. A. Gubbens et al, Ultramicroscopy 110 (2010) 962.
3. D.C. Joy and D.M. Maher, J. Microsc. 124 (1980) 37.
4. J. Verbeeck et al, Ultramicroscopy 106 (2006) 11.