Extended multi-structure local binary pattern for high-resolution image scene classification

International Geoscience and Remote Sensing Symposium (IGARSS)

Volumn 2016-November, Issue , 2016, Pages 5134-5137

  Bian, Xiaoyong ^a,b   Chen, Chen ^c   Du, Qian ^d   Sheng, Yuxia ^a  

^a WUHAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b HUBEI PROVINCE KEY LABORATORY OF INTELLIGENT INFORMATION PROCESSING AND REAL TIME INDUSTRIAL SYSTEM   (China)

^c The University of Texas at Dallas   (United States)

^d MISSISSIPPI STATE UNIVERSITY   (United States)

Author keywords

Feature extraction; High resolution image; Random texture; Rotation invariance; Spatial classification

Indexed keywords

EID: 85007420700     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IGARSS.2016.7730338     Document Type: Conference Paper

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