Permittivity measurement of ferroelectric thin film based on CPW transmission line

Journal of Electromagnetic Waves and Applications

Volumn 22, Issue 4, 2008, Pages 555-562

  Wu, Y Q ^a   Tang, Z X ^a   Xu, Y H ^a   He, X ^a   Zhang, B ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COPLANAR WAVEGUIDES; ELECTRIC LINES; PERMITTIVITY MEASUREMENT; REGRESSION ANALYSIS;

CPW TRANSMISSION LINE; MATERIAL UNDER TEST (MUT); PROPAGATION CONSTANTS; SVR (SUPPORT VECTOR REGRESSION) METHOD;

FERROELECTRIC THIN FILMS;

EID: 42549109575     PISSN: 09205071     EISSN: 15693937     Source Type: Journal    
DOI: 10.1163/156939308784150272     Document Type: Article

References (8)

1. Ouaddari, M., S. Delprat, F. Vidal, et al., "Microwave characterization of ferroelectric thin-film materials," IEEE Transactions on Microwave Theory and Techniques, Vol. 53, No. 4. 1390-1396, April 2005.
2. Wu, Y. Q., Z. X. Tang, B. Zhang, and Y. H. Xu, "Permeability measurement of ferromagnetic materials in microwave frequency range using support vector machine regression," Progress In Electromagnetics Research, PIER 70, 247-256, 2007.
3. Huang, R. F. and D. M. Zhang, "Application of mode matching method to analysis of axisymmetric coaxial discontinuity structures used in permeability and/or permittivity measurement," Progress In Electromagnetics Research, PIER 67, 205-230, 2007.
4. Chung B.-K., "Dielectric constant measurement for thin material at microwave frequencies," Progress In Electromagnetics Research, PIER 75, 239-252, 2007.
5. Kumar, A. and S. Sharma, "Measurement of dielectric constant and loss factor of the dielectric material at microwave frequencies," Progress In Electromagnetics Research, PIER 69, 47-54, 2007.
6. Xia, L., R. Xu, and B. Yan, "LTCC interconnect modeling by support vector regression," Progress In Electromagnetics Research, PIER 69, 67-75, 2007.
7. Tian, B., D. Yang, J. Tang, and Q. Liu, "Research on electro-magnetic parameters measurement using transmission/reflection method," Chinese Journal of Radio Science, Vol. 16, No. 1, 57-60, Match 2001.
8. Turker, N. and F. Gunes, "A competitive approach to neural device modeling: Support vector machine," International Conference on Artificial Neural Network, 974-981, Athens, Greece, Spt. 14, 2006.