Modeling multilayer X-ray reflectivity using genetic algorithms

AIP Conference Proceedings

Volumn 521, Issue , 2000, Pages 293-298

  Sanchez del Rio M ^a   Pareschi, G ^b   Michetschlager C ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b INAF OSSERVATORIO ASTRONOMICO DI BRERA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL STORAGE; FUNCTIONS; GLOBAL OPTIMIZATION; MULTILAYERS; REFLECTION; STOCHASTIC MODELS; STOCHASTIC SYSTEMS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAYS;

GLOBAL OPTIMIZATION METHOD; INITIAL PARAMETER; MULTILAYER REFLECTIVITY; NONLINEAR FUNCTIONS; OPTIMUM PARAMETERS; STOCHASTIC METHODS; TARGET APPLICATION; X RAY REFLECTIVITY;

GENETIC ALGORITHMS;

EID: 85002860747     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1291803     Document Type: Conference Paper

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