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Volumn 178, Issue , 2017, Pages 33-37

In situ TEM Raman spectroscopy and laser-based materials modification

Author keywords

In situ TEM; MoS2; Pulsed laser ablation; Raman spectroscopy

Indexed keywords

ABLATION; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON GUNS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IN SITU PROCESSING; LASER ABLATION; LASER EXCITATION; MOLYBDENUM COMPOUNDS; OPTICAL FIBERS; PROBES; PULSED LASERS; RAMAN SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84995687620     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2016.06.011     Document Type: Article
Times cited : (18)

References (22)
  • 8
    • 84871444732 scopus 로고    scopus 로고
    • Electron Energy-Loss Spectroscopy in the Electron Microscope
    • 3rd Edition Springer Science & Business Media New York
    • [8] Egerton, R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope. 3rd Edition, 2011, Springer Science & Business Media, New York.
    • (2011)
    • Egerton, R.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.