Enhanced Low Dose Rate Sensitivity (ELDRS) Observed in RADFET Sensor

European Space Agency, (Special Publication) ESA SP

Volumn 2003-September, Issue , 2003, Pages 669-671

  Kim, S J ^a   Seon, J ^b   Min, K W ^a   Shin, Y H ^c   Choe, W ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b SaTReCi   (South Korea)

^c Komed Company Ltd   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION EFFECTS;

DOSE RATE DEPENDENCE; ENHANCED LOW-DOSE-RATE SENSITIVITY; PMOSFET; SPACE MISSIONS;

DOSIMETRY;

EID: 84995685561     PISSN: 03796566     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

1. A. Holmes-Siedie, "The Space-Charge Dosimeter: General Principles of a New Method of Radiation Detection, " Nuclear Instruments and Methods, vol. 121, pp. 169, 1974.
2. Y. H. Shin, K. W. Min, J. G. Rbee, D. H. Lee, S. H. Kim, H. S. Kim, S. D. Park, D. K. Sung, and S. D. Choi, "Analysis of anomalous TDE data on board the KITSAT-1", IEEE Trans. Nucl. Sci., vol. 46, no. 6, pp. 1586-1594, Dec. 1999.
3. S. S. Kim, K. W. Min, Y. H. Shin, and J. Seon, "Model-Data Comparison of Total Dose Experiment on KITS AT-1", IEEE Trans. Nucl. Sci., vol. 49, no. 6, pp. 2818-2821, Dec. 2002.
4. D. M. Fleetwood, P. S. Winokur, and J. R, Schwank, "Using laboratory X-ray and cobalt-60 irradiations to predict CMOS device response in strategic and space environments", IEEE Trans. Nucl. Sci., vol. 35, No. 6, pp. 1497-1505, Dec. 1988.
5. J. R. Schwank, S. B. Roeske, D. E. Beutler, D. J. Moreno, and M. R. Shaneyfelt, "A Dose Rate Independent pMOS Dosimeter for Space Applications", IEEE Trans. Nucl. Sci., vol. 43, no. 6, pp. 2671-2678, Dec. 1996.
6. R.N. Nowlin, E. W. Enlow, R. D. Schrimpf and W. E. Combs, "Trends in the total-dose response of modem bipolar transistors",, IEEE Trans. Nucl Sci., vol. 39, no. 6, pp. 2026-2032, Dec. 1992.
7. S. McClure, R. L. Pease, W. Will and G. Perry, "Dependence of total dose response of bipolar linear microcircuits on applied dose rate", IEEE Trans. Nucl. Sci, vol. 41, no. 6, pp. 2544-2549, Dec. 1994.
8. J. Beaucour, T. Carriere, A. Gach, and D. Laxague, "Total dose effects on negative voltage regulator, " IEEE Trans. Nucl. Sci., vol. 41, no. 6, pp. 2420-2426, Dec. 1994.
9. D. M. Fleetwood, L. C. Riewe, J. R. Schwank. S. C. Witczak, and R. D. Schirapf, "Radiation Effects at Low Electric Fields in Thermal, S1MOX, and Bipolar Base Oxides, ", IEEE Trans. Nucl. Sci., vol. 43, no. 6, pp. 2537-2543, Dec. 1996.
10. J. L. Titus, W. E. Combs, T. L. Turflinger, J. F. Krieg, H. J. Tausch, D. B. Brown, R. L. Pease, and A. B. Campbell, "First Observations of Enhanced Low Dose Rate Sensitivity (ELDRS) in Space: One Part of the MPTB Experiment, " IEEE Trans. Nucl. Sci, vol. 45, no. 6, pp. 2673-2680, Dec. 1998.
11. Summary of Ike uses and availability of RADFET dosimeters and electronics. Radiation Experiments and Monitors, England, 1995.
12. A. Holmes-Siedie, "REM's Integrating Dosimeter System Based on the RADFET: An Introduction", Technical Report REM-02-1 TR, 2002.
13. N. S. Saks, D. B. Brown, and R. W. Rendell, "Effects of Switched Bias on Radiation-Induced Interface Trap Formation", IEEE Trans. Nucl. Sci, vol. 38, no. 6, pp. 1130-1139, Dec. 1991.
14. S. C. Witczak, R. C. Lacoe, D. C. Mayer, D. M. Fleetwood, R. D. Schrimpf, and K. F. Galloway, "Space Charge Limited Degradation of Bipolar Oxides at Low Electric Fields", IEEE Trans. Nucl. Sci, vol. 45, no. 6, pp. 2339-2351, Dec. 1998.