EMI analysis methods for synchronous buck converter EMI root cause analysis

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2008-January, Issue , 2008, Pages

  Kam, Keong W ^a   Pommerenke, David ^a   Cheung Wei Lam, ^b   Steinfeld, Robert ^b  

^a University of Missouri Rolla   (United States)

^b APPLE INC   (United States)

Author keywords

DC DC synchronous buck converters; EMI; TEM cell

Indexed keywords

ELECTROMAGNETIC COMPATIBILITY; FREQUENCY DOMAIN ANALYSIS; POLYCHLORINATED BIPHENYLS; TIME DOMAIN ANALYSIS;

BROADBAND EMISSION; IMPEDANCE MEASUREMENT; JOINT TIME-FREQUENCY ANALYSIS; RADIATED EMISSIONS; ROOT CAUSE ANALYSIS; SYNCHRONOUS BUCK CONVERTER; TEM CELL; TEM-CELL MEASUREMENTS;

DC-DC CONVERTERS;

EID: 84990985561     PISSN: 10774076     EISSN: 21581118     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.2008.4652125     Document Type: Conference Paper

References (7)

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