Refinement of cryo-EM structures using scattering factors of charged atoms

Journal of Applied Crystallography

Volumn 49, Issue 5, 2016, Pages 1517-1523

  Yonekura, Koji ^a   Maki Yonekura, Saori ^a  

^a RIKEN SPring 8 Center   (Japan)

Author keywords

electron scattering factors; electron three dimensional crystallography; single particle analysis

Indexed keywords

ATOMS; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRON SCATTERING; ELECTRONS; MEDICAL IMAGING;

CHARGED AMINO ACIDS; CRYO-ELECTRON MICROSCOPY (CRYO-EM) MAPS; ELECTRON DIFFRACTION DATA; SCATTERING FACTORS; SINGLE-PARTICLE ANALYSIS; STRUCTURAL BIOLOGY; STRUCTURE REFINEMENTS; THREE-DIMENSIONAL CRYSTALS;

CRYSTAL ATOMIC STRUCTURE;

EID: 84989850868     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S1600576716011274     Document Type: Article

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