Multimodal biometrics: An overview

European Signal Processing Conference

Volumn 06-10-September-2004, Issue , 2015, Pages 1221-1224

  Ross, Arun ^a   Jain, Anil K ^b  

^a WEST VIRGINIA UNIVERSITY   (United States)

^b MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOMETRICS; DEGREES OF FREEDOM (MECHANICS);

BIOMETRIC SYSTEMS; ERROR RATE; INTEGRATION STRATEGY; INTRA-CLASS VARIATION; MULTI-MODAL BIOMETRICS; MULTIMODAL BIOMETRIC SYSTEMS; MULTIMODAL SYSTEM; MULTIPLE SOURCE;

SIGNAL PROCESSING;

EID: 84979911620     PISSN: 22195491     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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