Accelerating soft-error-rate (SER) estimation in the presence of single event transients

Proceedings - Design Automation Conference

Volumn 05-09-June-2016, Issue , 2016, Pages

  Li, Ji ^a   Draper, Jeffrey ^b  

^a University of Southern California   (United States)

^b UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER CIRCUITS; ERROR CORRECTION; ERRORS; HIGH ELECTRON MOBILITY TRANSISTORS; RADIATION HARDENING; RECONFIGURABLE HARDWARE; PULSE ANALYZING CIRCUITS;

BENCHMARK CIRCUIT; COMBINATIONAL LOGIC CIRCUITS; PARALLEL PROCESSING; RADIATION-INDUCED; SER ESTIMATIONS; SINGLE EVENT TRANSIENTS; SOFT ERROR RATE ESTIMATIONS; SPEED IMPROVEMENT;

TRANSIENTS;

EID: 84977156764     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2897937.2897976     Document Type: Conference Paper

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