Ultrafast dark-field surface inspection with hybrid-dispersion laser scanning

Applied Physics Letters

Volumn 104, Issue 25, 2014, Pages

  Yazaki, Akio ^a,b   Kim, Chanju ^a,c   Chan, Jacky ^a   Mahjoubfar, Ata ^a   Goda, Keisuke ^a,d   Watanabe, Masahiro ^b   Jalali, Bahram ^a,e,f  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b HITACHI LTD   (Japan)

^c Gwangju Institute of Science and Technology (GIST)   (South Korea)

^d UNIVERSITY OF TOKYO   (Japan)

^e Department of Civil and Environmental Engineering   (United States)

^f UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCIDENT PREVENTION; INSPECTION; LIGHT EMITTING DIODES; LITHIUM ALLOYS; LITHIUM COMPOUNDS; LITHIUM-ION BATTERIES; MANUFACTURE; ORGANIC LIGHT EMITTING DIODES (OLED); SMARTPHONES; SPEED;

CURRENT TECHNOLOGY; HIGH-EFFICIENCY SOLAR CELLS; INDUSTRIAL MANUFACTURING; MANUFACTURING COST; ORGANIC LIGHT EMITTING DIODE DISPLAY; REAL-TIME IDENTIFICATION; REALTIME INSPECTION; SURFACE INSPECTION;

SURFACE DEFECTS;

EID: 84976591699     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/l.4885l47     Document Type: Article

References (19)

1. E. N. Malamas, E. Petrakis, M. Zervakis, L. Petit, and J. D. Legat. Image Vision Comput. 21. 171 (2003).
2. T. S. Newman and A. K. Jain. Comput. Vision Image Understanding 61, 231 (1995).
3. A. Kumar. IEEE Trans. Ind. Electron. 55, 348 (2008).
4. J. Laitinen, Proc. SPIE 3029. 78 (1997).
5. J.H. Sorebo and R.D. Lorenz, IEEE Trans. Ind. Appl. 41, 1476 (2005).
6. C. S. Cho, B. M. Chung, and M. J. Park, IEEE Trans. Ind. Electron. 52. 1073 (2005).
7. D. M. Tsai and T. Y. Huang, Image Vision Comput. 21, 307 (2003).
8. R. Rosch, F. C. Krebs, D. M. Tanenbaum. and H. Hoppe, Sol. Energy Mater. Sol. Cells 97. 176 (2012).
9. P. Tang. D. Huber. and B. Akinci. J. Comput. Civil Eng. 25.31 (2011).
10. F. Pemkopf and P. O'Leary, NDT&E Int. 36, 609 (2003).
11. K. Goda. K. K. Tsia, and B. Jalali. Appl. Phys. Lett. 93, 131109 (2008)., .
12. K. Goda, A. Mahjoubfar, C. Wang, A. Fard, J. Adam, D. R. Gossett, A. Ayazi, E. Sollier, O. Malik, E. Chen, Y. Liu, R. Brown, N. Sarkhosh, D. Di Carlo, and B. Jalali. Sci. Rep. 2. 445 (2012).
13. A. Mahjoubfar, K. Goda, C. Wang, A. Fard, J. Adam, D. R. Gossett, A. Ayazi, E. Sollier, O. Malik, E. Chen, Y. Liu, R. Brown, N. Sarkhosh, D. Di Carlo, and B. Jalali, Proc. SPIE 8611, 86110N (2013).
14. K. Goda and B. Jalali. Nat. Photonics 7, 102 (2013).
15. K. Goda, D. R. Solli, K. K. Tsia, and B. Jalali. Phys. Rev. A 80. 043821 (2009).
16. K. Goda, A. Ayazi, D. R. Gossett, J. Sadasivam, C. K. Lonappan, E. Sollier, A. M. Fard, S. C. Hur, J. Adam, C. Murray, C. Wang, N. Brackbill, D. Di Carlo, and B. Jalali. Proc. Natl. Acad. Sci. U.S.A. 109. 11630(2012).
17. H. W. Chen, C. Wang, A. Yazaki. C. Kim, K. Goda, and B. Jalali. Appl. Opt. 52, 4072(2013).
18. T. Jannson, Opt. Lett. 8, 232 (1983).
19. J. Azana and M. A. Muriel, IEEE J. Quantum Electron. 36, 517 (2000).