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Volumn 1, Issue , 2002, Pages 611-615

Fuse protection of IGCTs against rupture in three-level commutated inverter

Author keywords

fuse; IGCT; inverter

Indexed keywords

ELECTRIC FUSES;

EID: 84973454502     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPST.2002.1053615     Document Type: Conference Paper
Times cited : (15)

References (12)
  • 3
    • 0033335229 scopus 로고    scopus 로고
    • Use of an LC Filter to Achieve a Motor-friendly Performance of the PWM Voltage Source Inverter
    • September
    • J.K.Steinke, "Use of an LC Filter to Achieve a Motor-friendly Performance of the PWM Voltage Source Inverter", IEEE Trans. on Energy Conversion, vol.14, no.3, September 1999, pp.649-654
    • (1999) IEEE Trans. on Energy Conversion , vol.14 , Issue.3 , pp. 649-654
    • Steinke, J.K.1
  • 4
    • 17644393039 scopus 로고    scopus 로고
    • Medium Voltage Drive Converter for Industrial Applications in the power range from 0.5MW to 5MW based on a three-level converters equipped with IGCTs
    • Steinke, J.K.; Steimer, P.K., "Medium Voltage Drive Converter for Industrial Applications in the power range from 0.5MW to 5MW based on a three-level converters equipped with IGCTs" PWM Medium Voltage Drives (Ref.No.2000/063), IEE Seminar, 2000 Page(s): 6/1-6/4
    • (2000) PWM Medium Voltage Drives (Ref.No.2000/063), IEE Seminar , pp. 6/1-6/4
    • Steinke, J.K.1    Steimer, P.K.2
  • 6
    • 0035272506 scopus 로고    scopus 로고
    • Investigation of a high-power Three-level quasi-resonant DC-link voltage-source inverter
    • MARCH/April
    • Thomas Brückner, Steffen Bernet, "Investigation of a high-power Three-level quasi-resonant DC-link voltage-source inverter", IEEE on Industry Applications, Vol.37, No.2, MARCH/April 2001
    • (2001) IEEE on Industry Applications , vol.37 , Issue.2
    • Brückner, T.1    Bernet, S.2
  • 7
    • 0031353352 scopus 로고    scopus 로고
    • IGBT module Rupture Categorization and Testing
    • New Orleans, Louisiana, October 5-9
    • D.Braun, D.pixler, P.LeMay, "IGBT module Rupture Categorization and Testing", IEEE Industry Society Annual Meeting.New Orleans, Louisiana, October 5-9,1997
    • (1997) IEEE Industry Society Annual Meeting
    • Braun, D.1    Pixler, D.2    LeMay, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.