IGBT module rupture categorization and testing

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1997, Pages 1259-1266

  Braun, D ^a   Pixler, D ^a   LeMay, P ^a  

^a Rockwell Automation Allen Bradley ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; ELECTRIC FUSES; ELECTRIC INVERTERS; GATES (TRANSISTOR); OPTIMIZATION; SEMICONDUCTOR DEVICE TESTING;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

BIPOLAR TRANSISTORS;

EID: 0031353352     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)