Direct determination of S and P at trace level in stainless steel by CCD-based ICP-AES and EDXRF: A comparative study

Atomic Spectroscopy

Volumn 37, Issue 1, 2016, Pages 19-24

  Adya, V C ^a   Sengupta, Arijit ^a   Thulasidas, S K ^a   Natarajan, V ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84969185784     PISSN: 01955373     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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