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Volumn , Issue , 2002, Pages 1-5

An assessment of lead free solder (Sn3.7Ag0.8Cu) wettability

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; GOLD COATINGS; NICKEL COATINGS; PRINTED CIRCUIT BOARDS; PRINTED CIRCUITS; SOLDERED JOINTS; SOLDERING; SOLDERING ALLOYS; TIN; WETTING;

EID: 84964621653     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2002.1185587     Document Type: Conference Paper
Times cited : (7)

References (14)
  • 1
    • 84964580071 scopus 로고    scopus 로고
    • http://www.nemi.org/Newsroom/PR/2000/PR012400.html.
  • 2
    • 84964646264 scopus 로고    scopus 로고
    • http://europa.eu.int/rapid/start/cgi/guesten.ksh?p-action.gettxt=gt&doc=IP/00/602|0|RAPID&lg=EN
  • 4
    • 0033320225 scopus 로고    scopus 로고
    • The Analysis of the withdrawal force curve of the wetting balance curve
    • Sept
    • Jae Yong Park, Jae Pil Jung, and Choon Sik Kang, 'The Analysis of the withdrawal force curve of the wetting balance curve' IEEE Trac of Comp and Pkg. Tech vol 22, No.3 Sept 1999
    • (1999) IEEE Trac of Comp and Pkg. Tech , vol.22 , Issue.3
    • Park, J.Y.1    Jung, J.P.2    Kang, C.S.3
  • 6
    • 0030141874 scopus 로고    scopus 로고
    • Effects of PCB Finish on the Reliability and Wettability of BGA Packages
    • May
    • Edwin Bradley, and Kingshuk Banerji, 'Effects of PCB Finish on the Reliability and Wettability of BGA Packages' IEEE Tranc CPMT, Part B, Vol.19, No 2, May 1996
    • (1996) IEEE Tranc CPMT, Part B , vol.19 , Issue.2
    • Bradley, E.1    Banerji, K.2
  • 8
    • 0008244924 scopus 로고    scopus 로고
    • Worldwide Environmental Issue In Electronics And The Transition To Lead-free
    • Minneapolis, October
    • Kay Nimmo, "Worldwide Environmental Issue In Electronics And The Transition To Lead-free", Proceedings of the IPC Lead Free Summit, Minneapolis, October 1999.
    • (1999) Proceedings of the IPC Lead Free Summit
    • Nimmo, K.1
  • 10
    • 84964572959 scopus 로고    scopus 로고
    • Flux Evaporation Study using TGA/DSC
    • Intel MTD Internal report: 'Flux Evaporation Study using TGA/DSC' 2001.
    • (2001) Intel MTD Internal Report


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.