SEM investigation on IGBT latch-up failure

2001 6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001 - Proceedings

Volumn 2, Issue , 2001, Pages 1040-1042

  Wu, Wuchen ^a   Fan, Changyong ^a   Wang, Yajie ^a   Wang, Yangang ^a   Cui, Xueqing ^a   Jacob, P ^b   Held, M ^b  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84964526724     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSICT.2001.982074     Document Type: Conference Paper

References (4)

1. P.D.Taylor, "Thyristor Design and Realization", John Wiley & Sons, 1987, p.66
2. A.P.Silard,et al., "The Importance of the n-Base in p-n-p-n -like Structure Subjected to dv/dt Ramps", IEEE EDL, Vol.EDL-9, p.197-199, May 1988
3. B.J.Baliga, "Modern Power Devices", John Wiley & Sons, 1987, p.369
4. A.L.Robinson, et al., "Lateral Insulated Gate Transistors with Improved Latching Characteristics", IEEE EDL, Vol. EDL-7, p.61-63, Feb. 198