Microwave properties of the MSM photodetectors with 2-DEG

ASDAM 1998 Conference Proceedings: 2nd International Conference on Advanced Semiconductor Devices And Microsystems

Volumn 1998-October, Issue , 1998, Pages 295-298

  Tomáška, Martin ^a   Marso, Michel ^b   Fox, Alfred ^b   Kordoš, Peter ^b  

^a SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY RESPONSE; MICROSYSTEMS; PHOTONS; SEMICONDUCTOR DEVICES;

DIFFERENT STRUCTURE; LOW OPERATING VOLTAGE; MICROWAVE PROPERTY; MICROWAVE REGION; MSM PHOTODETECTOR;

PHOTODETECTORS;

EID: 84963924375     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASDAM.1998.730221     Document Type: Conference Paper

References (2)

1. M. Tomáška, M. Marso, A. Fox, P. Kordoš: Influence of the 2-DEG on the MSM Photodetector Properties, in Proc. of the 7th European Workshop on Heterostructure Technology, HETECIT97, Jülich, Germany, 1997.
2. M. Tomáśka, F. Uherek, J. Jakabović: High-speed Heterostructure Photodetectors Characterisation, in Proc. of the ASDAM'98 Conference, Smolenice, Slovakia, 1998.