Feature Selection and Analysis of Diffraction Images

Proceedings - 2015 IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2015

Volumn , Issue , 2015, Pages 80-88

  Thati, Sai Kiran ^a   Ding, Junhua ^a   Zhang, Dongmei ^b   Hu, Xin Hua ^a  

^a EAST CAROLINA UNIVERSITY   (United States)

^b CHINA UNIVERSITY OF GEOSCIENCES   (China)

Author keywords

Correlation based Feature Selection Algorithm (CFS); Extensive Feature Correlaion Study (EFCS); Gray Level Co Occurrence Matrix (GLCM); Logistic Model Trees (LMT); Polarization Diffraction Imaging Flow Cytometry(p DIFC); Support Vector Machine (SVM)

Indexed keywords

C (PROGRAMMING LANGUAGE); CELLS; COMPUTER SOFTWARE SELECTION AND EVALUATION; CYTOLOGY; DIFFRACTION; FEATURE EXTRACTION; IMAGE ANALYSIS; IMAGE PROCESSING; SOFTWARE RELIABILITY; SUPPORT VECTOR MACHINES; TREES (MATHEMATICS);

DIFFRACTION IMAGING; EXTENSIVE FEATURE CORRELAION STUDY (EFCS); FEATURE SELECTION ALGORITHM; GRAY LEVEL CO OCCURRENCE MATRIX(GLCM); LOGISTIC MODELS;

CLASSIFICATION (OF INFORMATION);

EID: 84963568755     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/QRS-C.2015.23     Document Type: Conference Paper

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