TanDEM-X: A single-pass SAR interferometer for global DEM generation and demonstration of new SAR techniques

International Geoscience and Remote Sensing Symposium (IGARSS)

Volumn 2015-November, Issue , 2015, Pages 2888-2891

  Zink, Manfred ^a   Bachmann, Markus ^a   Brautigam, Benjamin ^a   Fritz, Thomas ^a   Hajnsek, Irena ^a   Krieger, Gerhard ^a   Moreira, Alberto ^a   Wessel, Birgit ^a  

^a GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

bistatic SAR formation; global Digital Elevation Model (DEM); SAR interferometry; TanDEM X

Indexed keywords

EID: 84962552265     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IGARSS.2015.7326418     Document Type: Conference Paper

References (18)

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