Bistatic system and baseline calibration in TanDEM-X to ensure the global digital elevation model quality

ISPRS Journal of Photogrammetry and Remote Sensing

Volumn 73, Issue , 2012, Pages 3-11

  Hueso González, Jaime ^a   Walter Antony, John Mohan ^a   Bachmann, Markus ^a   Krieger, Gerhard ^a   Zink, Manfred ^a   Schrank, Dirk ^a   Schwerdt, Marco ^a  

^a GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

Accuracy; Calibration; Digital; Interferometer; SAR; Satellite; Space

Indexed keywords

ACCURACY; BASELINE CALIBRATION; BISTATIC SYSTEMS; DIGITAL; DIGITAL ELEVATION MODEL; HIGH QUALITY; INTERFEROMETRIC BASELINES; RANGE MEASUREMENTS; SAR; SATELLITE MISSION; SPACE; SYNTHETIC APERTURE RADAR INTERFEROMETRY; TANDEM-X;

DIGITAL INSTRUMENTS; GEOMORPHOLOGY; INTERFEROMETERS; INTERFEROMETRY; SATELLITES; SURVEYING; SYNTHETIC APERTURE RADAR;

CALIBRATION;

ACCURACY ASSESSMENT; CALIBRATION; DIGITAL ELEVATION MODEL; INTERFEROMETRY; RADAR INTERFEROMETRY; SATELLITE MISSION; SYNTHETIC APERTURE RADAR; TANDEM-X;

EID: 84867883331     PISSN: 09242716     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.isprsjprs.2012.05.008     Document Type: Article

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