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Volumn , Issue , 2000, Pages 163-166
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Non-linear noise mechanisms in SiGe BiCMOS devices
a,b a c c a a,b a,b a,b |
Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC NOISE MEASUREMENT;
BICMOS TECHNOLOGY;
HETEROJUNCTION BIPOLAR TRANSISTORS;
INTEGRATED CIRCUIT DESIGN;
INTEGRATED CIRCUITS;
MICROWAVE OSCILLATORS;
MONOLITHIC INTEGRATED CIRCUITS;
PHASE NOISE;
RECONFIGURABLE HARDWARE;
SEMICONDUCTING SILICON;
SILICON;
SILICON ALLOYS;
COMMERCIAL TECHNOLOGY;
INTRINSIC NOISE;
LOW PHASE NOISE;
LOW-FREQUENCY NOISE MODELING;
MEASUREMENT CORRELATIONS;
NOISE MECHANISMS;
RESIDUAL PHASE NOISE MEASUREMENT;
STATE OF THE ART;
NOISE GENERATORS;
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EID: 84962018353
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SMIC.2000.844323 Document Type: Conference Paper |
Times cited : (2)
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References (4)
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