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Volumn 3, Issue , 2002, Pages 1112-1117

Development of the 2nd generation SVCS using IEGT

Author keywords

IEGT; IEGT converter; SVCS

Indexed keywords

DAMPING; METALS; OXIDE SEMICONDUCTORS; POWER CONVERTERS; POWER SEMICONDUCTOR DEVICES; RECONFIGURABLE HARDWARE; SEMICONDUCTOR DEVICES; VALUE ENGINEERING;

EID: 84961911771     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PCC.2002.998128     Document Type: Conference Paper
Times cited : (13)

References (5)
  • 3
    • 0031167548 scopus 로고    scopus 로고
    • 4.5kV Injection Enhanced Gate Transistor: Experimental Verification of the Electrical Characteristics
    • A
    • Mitsuhiko Kitagawa, Shigeru Hasegawa, Tomoki Inoue, Akihiro Yahata, Hiromichi Ohashi "4.5kV Injection Enhanced Gate Transistor: Experimental Verification of the Electrical Characteristics" Jpn. J. Appl. Phys, Vol.36(1997) Pt.1, No.6A
    • (1997) Jpn. J. Appl. Phys , vol.36 , Issue.6
    • Kitagawa, M.1    Hasegawa, S.2    Inoue, T.3    Yahata, A.4    Ohashi, H.5
  • 4
    • 0039290190 scopus 로고    scopus 로고
    • Development of New High Power Converter Using IEGT
    • Masayuki Tobita, Ryoichi Kushibiki "Development of New High Power Converter Using IEGT" IPEC-Tokyo 2000.
    • IPEC-Tokyo 2000
    • Tobita, M.1    Kushibiki, R.2
  • 5
    • 84961902775 scopus 로고    scopus 로고
    • Development of IEGT Series and Parallel Connection Technology for high Power Converters
    • Tatsuhiko Nakajima, Tomotsugu Ishizuka "Development of IEGT Series and Parallel Connection Technology for high Power Converters" IPEC-Tokyo 2000
    • IPEC-Tokyo 2000
    • Nakajima, T.1    Ishizuka, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.