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Volumn , Issue , 2001, Pages 114-117

Numerical study of partial-SOI LDMOSFET power devices

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; MOS DEVICES; SEMICONDUCTOR DEVICES; SILICON;

EID: 84961786713     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISDRS.2001.984452     Document Type: Conference Paper
Times cited : (7)

References (7)
  • 1
    • 0028466825 scopus 로고
    • Silicon-on-Insulator Devices for High Voltage and Power IC Applications
    • E. Arnold, "Silicon-on-Insulator Devices for High Voltage and Power IC Applications," J. Electrochem. Soc., Vol. 141, No. 7, pp.1983-1988, 1994.
    • (1994) J. Electrochem. Soc. , vol.141 , Issue.7 , pp. 1983-1988
    • Arnold, E.1
  • 5
    • 0035396477 scopus 로고    scopus 로고
    • Fully-Coupled Electro-Thermal Mixed-Mode Device Simulation of SiGe HBT Circuits
    • T. Grasser and S. Selberherr, "Fully-Coupled Electro-Thermal Mixed-Mode Device Simulation of SiGe HBT Circuits," IEEE Trans. Electron Devices, Vol. 48, No. 7, pp.1421-1427, 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , Issue.7 , pp. 1421-1427
    • Grasser, T.1    Selberherr, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.