Breakdown analysis in JI, SOI and partial SOI power structures

IEEE International SOI Conference

Volumn , Issue , 1997, Pages 102-103

  Udrea, F ^a   Popescu, A ^a   Milne, W ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN OF SOLIDS; INTEGRATED CIRCUITS; POWER ELECTRONICS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES;

JUNCTION ISOLATION TECHNOLOGY; POWER INTEGRATED CIRCUITS (PIC);

SILICON ON INSULATOR TECHNOLOGY;

EID: 0031371970     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)