The study on electro-physical properties of sandwich structures based on fullerite films

Proceedings - KORUS 2000: 4th Korea-Russia International Symposium on Science and Technology

Volumn 2, Issue , 2000, Pages 181-186

  Berdinsky, A S ^a   Shevtsov, Yu V ^b   Saranchin, Yu A ^a   Trubin, S V ^b   Shubin, Yu V ^b   Ayupov, B M ^b   Fink, D ^c   Chadderton, L T ^d   Lee, J H ^e  

^a NOVOSIBIRSK STATE TECHNICAL UNIVERSITY   (Russian Federation)

^b ENERGY SYSTEMS INSTITUTE   (Russian Federation)

^c HAHN MEITNER INSTITUT   (Germany)

^d AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^e University of Ulsan   (South Korea)

Author keywords

conductivity; current voltage characteristics; ellipsometry; fullerite film; IR spectroscopy; sandwich structure; spectra photometry

Indexed keywords

ALUMINUM; COPPER; ELECTRIC CONDUCTIVITY; ELLIPSOMETRY; INFRARED SPECTROSCOPY; SANDWICH STRUCTURES; SAPPHIRE; SINGLE CRYSTALS; TEMPERATURE DISTRIBUTION; X RAY DIFFRACTION ANALYSIS;

CONDUCTIVITY PROPERTIES; FULLERITE FILMS; MEASUREMENTS OF; TEMPERATURE DEPENDENCE; TOP CONTACT;

SILVER;

EID: 84960931373     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/KORUS.2000.866022     Document Type: Conference Paper

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