Network Analysis Beyond S-parameters: Characterizing and Modeling Component Behaviour under Modulated Large-Signal Operating Conditions

56th ARFTG Conference Digest: Metrology and Test for RF Telecommunications, ARFTG 2000

Volumn , Issue , 2000, Pages

  Verspecht, Jan ^a   Verbeyst, Frans ^a   Vanden Bossche, Marc ^a  

^a AGILENT TECHNOLOGIES   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE AMPLIFIERS;

BEHAVIOURAL MODEL; LARGE-SIGNALS; MMIC AMPLIFIERS; MODEL COMPONENTS; MODULATED SIGNAL; OPERATING CONDITION;

SCATTERING PARAMETERS;

EID: 84960419002     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2000.327421     Document Type: Conference Paper

References (1)

1. D. Barataud et al.,"A Novel Time Domain Characterization Technique of Intermodulation in Microwave Transistors. Application to the Vizualization of the Distortion of High-Efficiency Power Amplifiers," Conference Record of the IEEE Microwave Theory and Techniques Symposium 1997, Denver, Colorado (USA), pp.1687-1690, June 1997.