-
2
-
-
80053955854
-
-
T. F. Tian, Q. Q. Lei, X. Wang, and Y. Wang, Appl. Phys. Lett. 99, 142903 (2011). 10.1063/1.3646909
-
(2011)
Appl. Phys. Lett.
, vol.99
, pp. 142903
-
-
Tian, T.F.1
Lei, Q.Q.2
Wang, X.3
Wang, Y.4
-
3
-
-
0037100902
-
-
J. A. Anta, G. Marcelli, M. Meunier, and N. Quirke, J. Appl. Phys. 92, 1002 (2002). 10.1063/1.1489714
-
(2002)
J. Appl. Phys.
, vol.92
, pp. 1002
-
-
Anta, J.A.1
Marcelli, G.2
Meunier, M.3
Quirke, N.4
-
5
-
-
79957596201
-
-
K. Ishimoto, T. Tanaka, Y. Ohki, Y. Sekiguchi, and Y. Murata, Electr. Eng. Jpn. 176, 1 (2011) 10.1002/eej.21136.
-
(2011)
Electr. Eng. Jpn.
, vol.176
, pp. 1
-
-
Ishimoto, K.1
Tanaka, T.2
Ohki, Y.3
Sekiguchi, Y.4
Murata, Y.5
-
6
-
-
84923299233
-
-
S. T. Li, N. Zhao, Y. J. Nie, X. Wang, G. Chen, and G. Teyssedre, IEEE Trans. Dielectr. Electr. Insul. 22, 92 (2015). 10.1109/TDEI.2014.004524
-
(2015)
IEEE Trans. Dielectr. Electr. Insul.
, vol.22
, pp. 92
-
-
Li, S.T.1
Zhao, N.2
Nie, Y.J.3
Wang, X.4
Chen, G.5
Teyssedre, G.6
-
7
-
-
84922267263
-
-
J. M. Zhu, J. B. Shen, S. Y. Guo, and H. J. Sue, Carbon 84, 355 (2015). 10.1016/j.carbon.2014.12.031
-
(2015)
Carbon
, vol.84
, pp. 355
-
-
Zhu, J.M.1
Shen, J.B.2
Guo, S.Y.3
Sue, H.J.4
-
8
-
-
84928118194
-
-
Y. Zhou, J. L. He, J. Hu, X. Y. Huang, and P. K. Jiang, IEEE Trans. Dielectr. Electr. Insul. 22, 673 (2015). 10.1109/TDEI.2015.7076762
-
(2015)
IEEE Trans. Dielectr. Electr. Insul.
, vol.22
, pp. 673
-
-
Zhou, Y.1
He, J.L.2
Hu, J.3
Huang, X.Y.4
Jiang, P.K.5
-
10
-
-
0035929066
-
-
G. C. Montanari, G. Mazzanti, F. Palmieri, A. Motori, and G. Perego, J. Phys. D: Appl. Phys. 34, 2902 (2001). 10.1088/0022-3727/34/18/325
-
(2001)
J. Phys. D: Appl. Phys.
, vol.34
, pp. 2902
-
-
Montanari, G.C.1
Mazzanti, G.2
Palmieri, F.3
Motori, A.4
Perego, G.5
-
11
-
-
84862651688
-
-
F. Q. Tian, Q. Q. Lei, X. Wang, and Y. Wang, IEEE Trans. Dielectr. Electr. Insul. 19, 763 (2012) 10.1109/TDEI.2012.6215078.
-
(2012)
IEEE Trans. Dielectr. Electr. Insul.
, vol.19
, pp. 763
-
-
Tian, F.Q.1
Lei, Q.Q.2
Wang, X.3
Wang, Y.4
-
12
-
-
38949204896
-
-
Y. Murakami, M. Nemoto, S. Okuzumi, S. Masuda, M. Nagao, and N. Hozumi, IEEE Trans. Dielectr. Electr. Insul. 15, 33 (2008). 10.1109/T-DEI.2008.4446734
-
(2008)
IEEE Trans. Dielectr. Electr. Insul.
, vol.15
, pp. 33
-
-
Murakami, Y.1
Nemoto, M.2
Okuzumi, S.3
Masuda, S.4
Nagao, M.5
Hozumi, N.6
-
16
-
-
80052404814
-
-
T. C. Zhou, G. Chen, R. J. Liao, and Z. Q. Xu, J. Appl. Phys. 110, 043724 (2011). 10.1063/1.3626468
-
(2011)
J. Appl. Phys.
, vol.110
, pp. 043724
-
-
Zhou, T.C.1
Chen, G.2
Liao, R.J.3
Xu, Z.Q.4
-
18
-
-
84928111107
-
-
F. Q. Tian, J. Y. Yao, P. Li, Y. Wang, M. L. Wu, and Q. Q. Lei, IEEE Trans. Dielectr. Electr. Insul. 22, 1232 (2015). 10.1109/TDEI.2015.7076826
-
(2015)
IEEE Trans. Dielectr. Electr. Insul.
, vol.22
, pp. 1232
-
-
Tian, F.Q.1
Yao, J.Y.2
Li, P.3
Wang, Y.4
Wu, M.L.5
Lei, Q.Q.6
-
19
-
-
84941923398
-
-
Y. H. Wu, J. W. Zha, W. K. Li, S. J. Wang, and Z. M. Dang, Appl. Phys. Lett. 107, 112901 (2015). 10.1063/1.4930938
-
(2015)
Appl. Phys. Lett.
, vol.107
, pp. 112901
-
-
Wu, Y.H.1
Zha, J.W.2
Li, W.K.3
Wang, S.J.4
Dang, Z.M.5
-
20
-
-
33748288296
-
-
L. A. Dissado, V. Griseri, W. Peasgood, E. S. Cooper, K. Fukunaga, and J. C. Fothergill, IEEE Trans. Dielectr. Electr. Insul. 13, 903 (2006). 10.1109/TDEI.2006.1667752
-
(2006)
IEEE Trans. Dielectr. Electr. Insul.
, vol.13
, pp. 903
-
-
Dissado, L.A.1
Griseri, V.2
Peasgood, W.3
Cooper, E.S.4
Fukunaga, K.5
Fothergill, J.C.6
-
21
-
-
84890485782
-
-
K. Vandewal, S. Albrecht, E. T. Hoke, K. R. Graham, J. Widmer, J. D. Douglas, M. Schubert, W. R. Mateker, J. T. Bloking, G. F. Burkhard, A. Sellinger, J. M. J. Fréchet, A. Amassian, M. K. Riede, M. D. McGehee, D. Neher, and A. Salleo, Nat. Mater. 13, 63 (2014) 10.1038/NMAT3807.
-
(2014)
Nat. Mater.
, vol.13
, pp. 63
-
-
Vandewal, K.1
Albrecht, S.2
Hoke, E.T.3
Graham, K.R.4
Widmer, J.5
Douglas, J.D.6
Schubert, M.7
Mateker, W.R.8
Bloking, J.T.9
Burkhard, G.F.10
Sellinger, A.11
Fréchet, J.M.J.12
Amassian, A.13
Riede, M.K.14
McGehee, M.D.15
Neher, D.16
Salleo, A.17
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