Models of charge transport in electron-beam irradiated insulators

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 11, Issue 2, 2004, Pages 192-202

  Sessler, G M ^a   Figueiredo, M T ^b   Leal Ferreira, G F ^b  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Charge transport; Electrets; Electron irradiation; Fluoroethylenepropylene; Generation process; Polyimide; Radiation induced conductivity; Recombination process

Indexed keywords

CARRIER MOBILITY; COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRETS; ELECTRODES; ELECTRON IRRADIATION; ELECTRON TRAPS; HEAVY IONS; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION;

CHARGE TRANSPORT; FLUORETHYLENEPROPYLENE; GENERATION PROCESS; POLYAMIDE; RADIATION-INDUCED CONDUCTIVITY; RECOMBINATION PROCESS;

ELECTRON BEAMS;

EID: 2342578939     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2004.1285887     Document Type: Conference Paper

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