-
1
-
-
84959002639
-
-
International Standard ISO/IEC 9646-1/2/3. OSI – open system interconnection, information technology – open systems interconnection conformance testing methodology and framework – part 1: General concept – part 2: Abstract test suites specification – part 3: The tree and tabular combined notation (TTCN), June
-
International Standard ISO/IEC 9646-1/2/3. OSI – open system interconnection, information technology – open systems interconnection conformance testing methodology and framework – part 1: General concept – part 2: Abstract test suites specification – part 3: The tree and tabular combined notation (TTCN), June 1992.
-
(1992)
-
-
-
2
-
-
0002865451
-
An optimization technique for protocol conformance test generation based on UIO sequences and rural chinese postman tours
-
K. Sabnani and S. Aggarwal, editors, Elsevier Science
-
A.V. Aho, A.T. Dahbura, D. Lee, and M.U. Uyari. An optimization technique for protocol conformance test generation based on UIO sequences and rural chinese postman tours. In K. Sabnani and S. Aggarwal, editors, Protocol Specification, Testing and Verification VIII, volume 8. Elsevier Science, 1998.
-
(1998)
Protocol Specification, Testing and Verification VIII
, vol.8
-
-
Aho, A.V.1
Dahbura, A.T.2
Lee, D.3
Uyari, M.U.4
-
3
-
-
18244398035
-
The AVALON project: A VALidation environment for SDL/MSC description
-
O. Færgemand and A. Sarma, editors, Darmstadt, 1993. Elsevier Science Publishers B.V
-
B. Algayres, Y. Lejeune, F. Hugonnet, and F. Hants. The AVALON project: A VALidation environment for SDL/MSC description. In O. Færgemand and A. Sarma, editors, SDL’93Using Objects, Proceedings of the Sixth SDL Forum, pages 221–235, Darmstadt, 1993. Elsevier Science Publishers B.V.
-
SDL’93Using Objects, Proceedings of the Sixth SDL Forum
, pp. 221-235
-
-
Algayres, B.1
Lejeune, Y.2
Hugonnet, F.3
Hants, F.4
-
4
-
-
0002910454
-
Formal test automation: A simple experiment
-
G. Csopaki, S. Dibuz, and K. Tarnay, editors, Kluwer Academic
-
A. Belinfante, J. Feenstra, R.G. Vries, J. Tretmans, N. Goga, L. Feijs, S. Mauw, and L. Heerink. Formal test automation: A simple experiment. In G. Csopaki, S. Dibuz, and K. Tarnay, editors, Intenational Workshop on Testing of Comunication Systems, pages 179–196. Kluwer Academic, 1999.
-
(1999)
Intenational Workshop on Testing of Comunication Systems
, pp. 179-196
-
-
Belinfante, A.1
Feenstra, J.2
Vries, R.G.3
Tretmans, J.4
Goga, N.5
Feijs, L.6
Mauw, S.7
Heerink, L.8
-
5
-
-
33750167588
-
Formal test automation: The conference protocol with TGV/TorX
-
Canada
-
L. Bousquet, S. Ramangalahy, S. Simon, C. Viho, A. Belinfante, and R.G. Vries. Formal test automation: the conference protocol with TGV/TorX. Proceedings of Test Com 2000, Canada, 2000.
-
(2000)
Proceedings of Test Com 2000
-
-
Bousquet, L.1
Ramangalahy, S.2
Simon, S.3
Viho, C.4
Belinfante, A.5
Vries, R.G.6
-
6
-
-
0347104541
-
Conformance testing of a multimedia system using Phact
-
Alexandre Petrenko and Nina Yevtushenko, editors, Kluwer Academic
-
L.M.G. Feijs, F.A.C Meijs, J.R. Moonen, and J.J. vanWamel. Conformance testing of a multimedia system using Phact. In Alexandre Petrenko and Nina Yevtushenko, editors, Testing of Communicating Systems, volume 11, pages 143–210. Kluwer Academic, 1998.
-
(1998)
Testing of Communicating Systems
, vol.11
, pp. 143-210
-
-
Feijs, L.1
Meijs, F.2
Moonen, J.R.3
Vanwamel, J.J.4
-
7
-
-
72349100435
-
Using on-the-fly verification techniques for the generation of test suites
-
T. Alur and A. Henzinger, editors, New Brunswick, New Jersey, USA, volume 1102 of LNCS. Springer–Verlag
-
G. Fernandez, J.C. Jard, C. Jéron, and T. Viho. Using on-the-fly verification techniques for the generation of test suites. In T. Alur and A. Henzinger, editors, Computer-Aided Verification (CAV’96), New Brunswick, New Jersey, USA, volume 1102 of LNCS. Springer–Verlag, 1996.
-
(1996)
Computer-Aided Verification (CAV’96)
-
-
Fernandez, G.1
Jard, J.C.2
Jéron, C.3
Viho, T.4
-
8
-
-
84957379824
-
CADP: A protocol validation and verification toolbox
-
T. Alur and A. Henzinger, editors, New Brunswick, New Jersey, USA, volume 1102 of LNCS. Springer–Verlag
-
J.C. Fernandez, H. Garavel, A. Kerbrat, R. Mateescu, L. Mournier, and M. Sighireanu. CADP: A protocol validation and verification toolbox. In T. Alur and A. Henzinger, editors, Computer-Aided Verification (CAV’96), New Brunswick, New Jersey, USA, volume 1102 of LNCS. Springer–Verlag, 1996.
-
(1996)
Computer-Aided Verification (CAV’96)
-
-
Fernandez, J.C.1
Garavel, H.2
Kerbrat, A.3
Mateescu, R.4
Mournier, L.5
Sighireanu, M.6
-
9
-
-
72349100435
-
Using on–the–fly verification techniques for the generation of a test suites
-
T. Alur and A. Henzinger, editors, New Brunswick, New Jersey, USA, volume 1102 of LNCS. Springer–Verlag
-
J.C. Fernandez, C. Jard, T. Jeron, and C. Viho. Using on–the–fly verification techniques for the generation of a test suites. In T. Alur and A. Henzinger, editors, Computer-Aided Verification (CAV’96), New Brunswick, New Jersey, USA, volume 1102 of LNCS. Springer–Verlag, 1996.
-
(1996)
Computer-Aided Verification (CAV’96)
-
-
Fernandez, J.C.1
Jard, C.2
Jeron, T.3
Viho, C.4
-
10
-
-
84959002642
-
Eight years of experience in test generation from FDTs using TVEDA
-
T. Mizuno, N. Shiratori, T. Higashino, and A. Togashi, editors, Chapman and Hall
-
R. Groz and N. Risser. Eight years of experience in test generation from FDTs using TVEDA. In T. Mizuno, N. Shiratori, T. Higashino, and A. Togashi, editors, FORTE/PSTV’97. Chapman and Hall, 1997.
-
(1997)
FORTE/PSTV’97
-
-
Groz, R.1
Risser, N.2
-
12
-
-
84957046265
-
Test generation derived from model-checking
-
Nicolas Halbwachs and Doron Peled, editors, Springer
-
T. Jéron and P. Morel. Test generation derived from model-checking. In Nicolas Halbwachs and Doron Peled, editors, Computer-Aided Verification (CAV’99), volume 1633 of LNCS, pages 108–122. Springer, 1999.
-
(1999)
Computer-Aided Verification (CAV’99), Volume 1633 of LNCS
, pp. 108-122
-
-
Jéron, T.1
Morel, P.2
-
14
-
-
84894601442
-
A two–level approach to automated conformace testing of VHDL designs
-
M. Kim, S. Kang, and K. Hong, editors, Chapman and Hall
-
J.R. Moonen, J.M.T. Romijn, O. Sies, J.G. Springintveld, L.M.G. Feijs, and R.L.C. Koymans. A two–level approach to automated conformace testing of VHDL designs. In M. Kim, S. Kang, and K. Hong, editors, Testing of Communicating Systems, volume 10, pages 432–447. Chapman and Hall, 1997.
-
(1997)
Testing of Communicating Systems
, vol.10
, pp. 432-447
-
-
Moonen, J.R.1
Romijn, J.2
Sies, O.3
Springintveld, J.G.4
Feijs, L.5
Koymans, R.6
-
15
-
-
0006225670
-
Autolink – puting SDL–based test generation into practice
-
A. Petrenko, editor, Kluwer Academic
-
M. Schimitt, A. Ek, J. Grabowski, D. Hogrefe, and B. Koch. Autolink – puting SDL–based test generation into practice. In A. Petrenko, editor, Proceedings of the 11th International Workshop on Testing Comunicating Systems (IWTCS’98), pages 227–243. Kluwer Academic, 1998.
-
(1998)
Proceedings of the 11Th International Workshop on Testing Comunicating Systems (IWTCS’98)
, pp. 227-243
-
-
Schimitt, M.1
Ek, A.2
Grabowski, J.3
Hogrefe, D.4
Koch, B.5
-
16
-
-
0000101791
-
Test Generation with Inputs, Outputs and Repetitive Quiescence
-
Also: Technical 96-26, Centre for Telematics and Information Technology, University of Twente, The Netherlands
-
J. Tretmans. Test Generation with Inputs, Outputs and Repetitive Quiescence. Software—Concepts and Tools, 17(3), 1996. Also: Technical Report No. 96-26, Centre for Telematics and Information Technology, University of Twente, The Netherlands.
-
(1996)
Software—Concepts and Tools
, vol.17
, Issue.3
-
-
Tretmans, J.1
-
17
-
-
84958954983
-
Test sequence algorithms and formal language
-
IEEE Computer Society Press
-
S.P. van de Burgt. Test sequence algorithms and formal language. In Proceedings of Second Asian Test Symposium, volume 8, pages 136–146. IEEE Computer Society Press, 1993.
-
(1993)
Proceedings of Second Asian Test Symposium
, vol.8
, pp. 136-146
-
-
Van De Burgt, S.P.1
-
18
-
-
84863373723
-
The RNL Conformance Kit
-
J. de Meer, L.Mackert, and W. Effelsberg, editors, North– Holland, October
-
S.P. van de Burgt, J. Kroon, E. Kwast, and H.J. Wilts. The RNL Conformance Kit. In J. de Meer, L.Mackert, and W. Effelsberg, editors, Proceeding of the 2nd International Workshop on Protocol Test Systems, volume 2, pages 279–294. North– Holland, October 1989.
-
(1989)
Proceeding of the 2Nd International Workshop on Protocol Test Systems
, vol.2
, pp. 279-294
-
-
Van De Burgt, S.P.1
Kroon, J.2
Kwast, E.3
Wilts, H.J.4
-
19
-
-
0011865121
-
The UIOv–method for protocol test sequence generation
-
Jan de Meer, Lothar Machert, and Wolfgang Effelsberg, editors, North–Holland
-
S.T. Vuong, W.Y.L. Chan, and M.R. Ito. The UIOv–method for protocol test sequence generation. In Jan de Meer, Lothar Machert, and Wolfgang Effelsberg, editors, International Workshop on Protocol Test Systems, volume 2, pages 161–176. North–Holland, 1990.
-
(1990)
International Workshop on Protocol Test Systems
, vol.2
, pp. 161-176
-
-
Vuong, S.T.1
Chan, W.2
Ito, M.R.3
|