Influence of temperature on thermoelectric properties of FexCo1 - XS2 thin films: A semiconductor to semimetal conversion

Thin Solid Films

Volumn 600, Issue , 2016, Pages 19-24

  Clamagirand, J M ^a   Ares, J R ^a   Flores, E ^a   Diaz Chao, P ^a,b   Leardini, F ^a   Ferrer, I J ^a   Sanchez C ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Pyrite; Seebeck coefficient; Thermoelectricity; Thin films

Indexed keywords

PYRITES; SEEBECK COEFFICIENT; SEMICONDUCTOR DOPING; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; THIN FILMS; X RAY DIFFRACTION;

DIRECT SULFURATION; DONOR AND ACCEPTOR; ELECTRICAL CARRIERS; ORDERS OF MAGNITUDE; RAMAN MEASUREMENTS; TEMPERATURE INCREASE; THERMAL ACTIVATION; THERMOELECTRIC PROPERTIES;

COBALT;

EID: 84958633238     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2016.01.002     Document Type: Article

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