Co distribution through n-type pyrite thin films

Thin Solid Films

Volumn 516, Issue 20, 2008, Pages 7116-7119

  Diaz Chao P ^a   Ferrer, I J ^a   Sanchez C ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

Co doped; Pyrite; Semiconductor

Indexed keywords

COATINGS; COBALT ALLOYS; COBALT COMPOUNDS; IRON; PYRITES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SOLIDS; THICK FILMS; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS; X RAY FILMS;

ATOMIC RATIOS; BI-LAYERS; DEPTH PROFILING; PYRITE THIN FILMS; RUTHERFORD BACKSCATTERING (RBS); SULPHURATION; X-RAY DIFFRACTION MEASUREMENTS;

COBALT;

EID: 45949112178     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.028     Document Type: Article

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