Light-Directed Particle Patterning by Evaporative Optical Marangoni Assembly

Nano Letters

Volumn 16, Issue 1, 2016, Pages 644-650

  Varanakkottu, Subramanyan Namboodiri ^a,b,c   Anyfantakis, Manos ^a,b,c   Morel, Mathieu ^a,b,c   Rudiuk, Sergii ^a,b,c   Baigl, Damien ^a,b,c  

^a ECOLE NORMALE SUPÉRIEURE   (France)

^b SORBONNE UNIVERSITÉ   (France)

^c CNRS   (France)

Author keywords

directed assembly; evaporation; Marangoni flow; Particle patterning; photocontrol

Indexed keywords

EVAPORATION; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY;

COLLECTIVE PROPERTIES; DIRECTED ASSEMBLY; MARANGONI FLOWS; PARTICLE CHARACTERISTICS; PARTICLE DEPOSITIONS; PARTICLE PATTERNING; PHOTOCONTROL; PRE-DEFINED POSITION;

SUSPENSIONS (FLUIDS);

EID: 84957990413     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/acs.nanolett.5b04377     Document Type: Article

References (38)

1. Xia, Y.; Gates, B.; Yin, Y.; Lu, Y. Adv. Mater. 2000, 12, 693-713 10.1002/(SICI)1521-4095(200005)12:10<693::AID-ADMA693>3.0.CO;2-J
2. Maier, S. A.; Brongersma, M. L.; Kik, P. G.; Meltzer, S.; Requicha, A. A. G.; Koel, B. E.; Atwater, H. A. Adv. Mater. 2003, 13, 1501-1505 10.1002/1521-4095(200110)13:19<1501::AID-ADMA1501>3.0.CO;2-Z
3. Duggal, R.; Hussain, F.; Pasquali, M. Adv. Mater. 2006, 18, 29-34 10.1002/adma.200500625
4. Han, W.; Lin, Z. Angew. Chem., Int. Ed. 2012, 51, 1534-1546 10.1002/anie.201104454
5. Zhang, Z.; Zhang, X.; Xin, Z.; Deng, M.; Wen, Y.; Song, Y. Adv. Mater. 2013, 25, 6714-6718 10.1002/adma.201303278
6. Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Ivanov, I. B.; Yoshimura, H.; Nagayama, K. Nature 1993, 361, 26-26 10.1038/361026a0
7. Yin, Y.; Lu, Y.; Gates, B.; Xia, Y. J. Am. Chem. Soc. 2001, 123, 8718-8729 10.1021/ja011048v
8. Cui, Y.; Björk, M. T.; Liddle, J. A.; Sönnichsen, C.; Boussert, B.; Alivisatos, A. P. Nano Lett. 2004, 4, 1093-1098 10.1021/nl049488i
9. Vogel, N.; Retsch, M.; Fustin, C.-A.; del Campo, A.; Jonas, U. Chem. Rev. 2015, 115, 6265-6311 10.1021/cr400081d
10. Kraus, T.; Malaquin, L.; Schmid, H.; Riess, W.; Spencer, N. D.; Wolf, H. Nat. Nanotechnol. 2007, 2, 570-576 10.1038/nnano.2007.262
11. Ueda, M.; Kim, H.-B.; Ichimura, K. J. Mater. Chem. 1994, 4, 883-889 10.1039/jm9940400883
12. Klajn, R.; Wesson, P. J.; Bishop, K. J. M.; Grzybowski, B. A. Angew. Chem., Int. Ed. 2009, 48, 7035-7039 10.1002/anie.200901119
13. Palacci, J.; Sacanna, S.; Steinberg, A. P.; Pine, D. J.; Chaikin, P. M. Science 2013, 339, 936-940 10.1126/science.1230020
14. Piech, M.; George, M. C.; Bell, N. S.; Braun, P. V. Langmuir 2006, 22, 1379-1382 10.1021/la051636c
15. Georgiadis, A.; Routh, A. F.; Murray, M. W.; Keddie, J. L. Soft Matter 2011, 7, 11098-11102 10.1039/c1sm06527k
16. Vieyra Salas, J. A.; Van Der Veen, J. M.; Michels, J. J.; Darhuber, A. A. J. Phys. Chem. C 2012, 116, 12038-12047 10.1021/jp301092y
17. Harris, D. J.; Hu, H.; Conrad, J. C.; Lewis, J. A. Phys. Rev. Lett. 2007, 98, 148301 10.1103/PhysRevLett.98.148301
18. Roy, B.; Arya, M.; Thomas, P.; Jürgschat, J. K.; Venkata Rao, K.; Banerjee, A.; Malla Reddy, C.; Roy, S. Langmuir 2013, 29, 14733-14742 10.1021/la402777e
19. Kumar, A.; Chuang, H. S.; Wereley, S. T. Langmuir 2010, 26, 7656-7660 10.1021/la100614h
20. Garnier, N.; Grigoriev, R. O.; Schatz, M. F. Phys. Rev. Lett. 2003, 91, 054501 10.1103/PhysRevLett.91.054501
21. Vela, E.; Hafez, M.; Régnier, S. Int. J. Optomechatronics 2009, 3, 289-302 10.1080/15599610903389477
22. Deegan, R. D.; Bakajin, O.; Dupont, T. F.; Huber, G.; Nagel, S. R.; Witten, T. A. Nature 1997, 389, 827-829 10.1038/39827
23. Larson, R. G. Angew. Chem., Int. Ed. 2012, 51, 2546-2548 10.1002/anie.201108008
24. Kuang, M.; Wang, L.; Song, Y. Adv. Mater. 2014, 26, 6950-6958 10.1002/adma.201305416
25. Anyfantakis, M.; Baigl, D. ChemPhysChem 2015, 16, 2726-2734 10.1002/cphc.201500410
26. Anyfantakis, M.; Geng, Z.; Morel, M.; Rudiuk, S.; Baigl, D. Langmuir 2015, 31, 4113-4120 10.1021/acs.langmuir.5b00453
27. Anyfantakis, M.; Baigl, D. Angew. Chem., Int. Ed. 2014, 53, 14077-14081 10.1002/anie.201406903
28. Diguet, A.; Guillermic, R. M.; Magome, N.; Saint-Jalmes, A.; Chen, Y.; Yoshikawa, K.; Baigl, D. Angew. Chem., Int. Ed. 2009, 48, 9281-9284 10.1002/anie.200904868
29. Chevallier, E.; Mamane, A.; Stone, H. A.; Tribet, C.; Lequeux, F.; Monteux, C. Soft Matter 2011, 7, 7866-7874 10.1039/c1sm05378g
30. Venancio-Marques, A.; Barbaud, F.; Baigl, D. J. Am. Chem. Soc. 2013, 135, 3218-3223 10.1021/ja311837r
31. Baigl, D. Lab Chip 2012, 12, 3637-3653 10.1039/c2lc40596b
32. Varanakkottu, S. N.; George, S. D.; Baier, T.; Hardt, S.; Ewald, M.; Biesalski, M. Angew. Chem., Int. Ed. 2013, 52, 7291-7295 10.1002/anie.201302111
33. Venancio-Marques, A.; Baigl, D. Langmuir 2014, 30, 4207-4212 10.1021/la5001254
34. Diguet, A.; Mani, N. K.; Geoffroy, M.; Sollogoub, M.; Baigl, D. Chem.-Eur. J. 2010, 16, 11890-11896 10.1002/chem.201001579
35. Larson, R. G. AIChE J. 2014, 60, 1538-1571 10.1002/aic.14338
36. Biswas, S. C.; Chattoraj, D. K. Langmuir 1997, 13, 4505-4511 10.1021/la960905j
37. Bhardwaj, R.; Fang, X. H.; Somasundaran, P.; Attinger, D. Langmuir 2010, 26, 7833-7842 10.1021/la9047227
38. Still, T.; Yunker, P. J.; Yodh, A. G. Langmuir 2012, 28, 4984-4988 10.1021/la204928m