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Volumn 1304, Issue , 1997, Pages 448-456

Satisfiability on reconfigurable hardware

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EID: 84957878228     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-63465-7_250     Document Type: Conference Paper
Times cited : (24)

References (20)
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  • 10
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    • On the Acceleration of Test Generation Algorithms
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  • 11
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  • 13
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    • January
    • T. Larrabee, “Test Pattern Generation Using Boolean Satisfiability,” IEEE Trans, on CAD, Vol. 11, No. 1, pp. 4-15, January, 1992
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  • 18
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  • 19
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.