Statistical Models for Skin Detection

IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops

Volumn 8, Issue , 2003, Pages

  Jedynak, Bruno ^a   Zheng, Huicheng ^b   Daoudi, Mohamed ^b  

^a UNIV LILLE   (France)

^b ECOLE DES MINES DE DOUAI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; HIDDEN MARKOV MODELS; MARKOV PROCESSES; PATTERN RECOGNITION; PIXELS; TREES (MATHEMATICS);

BELIEF PROPAGATION ALGORITHM; FAST SOLUTIONS; FIRST-ORDER MODELS; MARGINAL DISTRIBUTION; MAXIMUM ENTROPY MODELING; PIXEL LOCATION; SKIN DETECTION; TREE APPROXIMATION;

PARAMETER ESTIMATION;

EID: 84954433036     PISSN: 21607508     EISSN: 21607516     Source Type: Conference Proceeding    
DOI: 10.1109/CVPRW.2003.10094     Document Type: Conference Paper

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