Statistical color models with application to skin detection

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 1, Issue , 1999, Pages 274-280

  Jones, Michael J ^a   Rehg, James M ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STRUCTURES; ERROR ANALYSIS; FEATURE EXTRACTION; IMAGE QUALITY; MATHEMATICAL MODELS; STATISTICAL METHODS; WORLD WIDE WEB;

HISTOGRAM LEARNING METHODS; STATISTICAL COLOR MODELS;

COMPUTER VISION;

EID: 0032665713     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (15)