Patent citation indicators: One size fits all?

Scientometrics

Volumn 106, Issue 1, 2016, Pages 187-211

  Bakker, Jurriën ^a   Verhoeven, Dennis ^a   Zhang, Lin ^a,b   Van Looy, Bart ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b NORTH CHINA UNIVERSITY OF WATER RESOURCES AND ELECTRIC POWER   (China)

Author keywords

EPO; Multivariate analysis; Patent citations; Patent family; PCT; USPTO

Indexed keywords

EID: 84954394964     PISSN: 01389130     EISSN: 15882861     Source Type: Journal    
DOI: 10.1007/s11192-015-1786-0     Document Type: Article

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