Quality assurance in the EPO patent information resource

World Patent Information

Volumn 32, Issue 4, 2010, Pages 279-286

  Albrecht, Miguel A ^a   Bosma, Rex ^a   van Dinter, Trudy ^a   Ernst, Jean Luc ^a   van Ginkel, Koen ^a   Versloot Spoelstra, Fenny ^a  

^a EUROPEAN PATENT OFFICE   (Netherlands)

Author keywords

Citation data; Classification data; Data standardisation; DOCDB; ECLA; EPO; Esp@cenet ; Examiner workflow; FTM; INPADOC; Master databases; MCD; NPL; OPS; Patent families; Patent Information Resource; PIR; Quality assurance; Reference identifier; REFI; RID

Indexed keywords

EID: 77958161975     PISSN: 01722190     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wpi.2009.09.001     Document Type: Article

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