|
Volumn , Issue , 2003, Pages 37-43
|
Differential de-embedding methodology for on-board CPU socket measurements
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DETERIORATION;
EMBEDDINGS;
PROBES;
SCATTERING PARAMETERS;
ABCD-PARAMETERS;
DE-EMBEDDING;
DE-EMBEDDING METHOD;
INTERFACE BOARDS;
PERFORMANCE DETERIORATION;
PLATED THROUGH HOLE;
S-PARAMETER DATA;
TEST STRUCTURE;
PRINTED CIRCUIT BOARDS;
|
EID: 84954237110
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ARFTGS.2003.1216865 Document Type: Conference Paper |
Times cited : (4)
|
References (7)
|