Accurate measurement of interface thermal resistance by means of a transient method

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 2000, Pages 167-173

  Bosch, Eric G T ^a   Lasance, Clemens J M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT RESISTANCE; INTERFACES (MATERIALS); SEMICONDUCTOR DEVICE MODELS; THERMAL CONDUCTIVITY OF SOLIDS;

THERMAL INTERFACE RESISTANCE;

ELECTRONICS PACKAGING;

EID: 0033732338     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (21)