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Volumn 2001-January, Issue , 2001, Pages 296-300

An effective current source cell model for VDSM delay calculation

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CYTOLOGY;

EID: 84949968485     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2001.915246     Document Type: Conference Paper
Times cited : (17)

References (4)
  • 2
    • 0028756124 scopus 로고
    • Modeling the "Effective capacitance" for the RC interconnect of CMOS gates
    • F. Dartu, N. Menezes, and L. T. Pillage, "Modeling the "Effective Capacitance" for the RC Interconnect of CMOS Gates", IEEE Trans. Computer-Aided Design, Vol. 13, pp. 1526-1535, 1994.
    • (1994) IEEE Trans. Computer-Aided Design , vol.13 , pp. 1526-1535
    • Dartu, F.1    Menezes, N.2    Pillage, L.T.3
  • 3
    • 0030141612 scopus 로고    scopus 로고
    • Performance computation for precharacterized CMOS gates with RC loads
    • J. Qian, S. Pullela, and L. T. Pileggi, "Performance Computation for Precharacterized CMOS Gates with RC Loads", IEEE Trans. Computer-Aided Design, Vol. 15, pp. 544-553, 1996.
    • (1996) IEEE Trans. Computer-Aided Design , vol.15 , pp. 544-553
    • Qian, J.1    Pullela, S.2    Pileggi, L.T.3
  • 4
    • 0030686019 scopus 로고    scopus 로고
    • Calculating worst-case gate delays due to dominant capacitance coupling
    • Anaheim, CA
    • F. Dartu and L. T. Pileggi, "Calculating Worst-Case Gate Delays Due to Dominant Capacitance Coupling", DAC 97, Anaheim, CA, pp. 46-51.
    • DAC 97 , pp. 46-51
    • Dartu, F.1    Pileggi, L.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.