Thermoelectric transport properties of single bismuth nanowires

International Conference on Thermoelectrics, ICT, Proceedings

Volumn 2002-January, Issue , 2002, Pages 243-248

  Cronin, S B ^a   Lin, Y M ^b   Black, M R ^b   Rabin, O ^a   Dresselhaus, M S ^a,b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b Department of Electrical Engineering and Computer Science   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ELECTRIC POWER FACTOR; ELECTRON BEAM LITHOGRAPHY; ELECTRONIC DENSITY OF STATES; OHMIC CONTACTS; SCANNING TUNNELING MICROSCOPY; THERMOCOUPLES;

BISMUTH NANOWIRES; DETAILED MODELING; ELECTRICAL CONTACTS; NON-OHMIC CONTACTS; PATTERN ELECTRODES; THERMOELECTRIC TRANSPORT PROPERTIES; TUNNELING MECHANISM; TUNNELING SPECTROSCOPY;

NANOWIRES;

EID: 84949812032     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICT.2002.1190310     Document Type: Conference Paper

References (18)

1. Lin, Y. M. et al, Phys. Rev. B, Vol. 62 (2000), pp. 4610.
2. Sun, X. et al, Appl. Phys. Lett., Vol. 74 (1999), pp. 4005.
3. Hicks, L. D. et al, "Thermoelectric figure of merit of one-dimensional conductor, " Phys. Rev. B, Vol. 47 (1993), pp. 16631-16634.
4. Chen, G. et al, Recent Trends in Thermoelectric Materials Research III. Academic Press (San Diego, CA, 2001), chapter 5.
5. Goldsmid, H.J, Thermoelectric Refrigeration, Plenum Press, (New York, NY, 1964).
6. Heremans, J. and Hansen, O.P., J. Phys. C, Vol. 12, (1974), pp. 771.
7. Hartman, R. Phys. Rev., Vol. 181 (1969), pp. 1070.
8. Zhang, Z., et al, Chem. Mater., Vol. 11 (1999), pp. 1659.
9. Cronin, S., et al, "The 18th International Conference on Thermoelectrics: Symposium Proceedings", Baltimore, MD, 1999.
10. Lin, Y.M., et al., "The 21th International Conference on Thermoelectrics: Symposium Proceedings", Long Beach, CA, 2002.
11. Cronin, S., et al, "Materials Research Society: Symposium Proceedings, Fall 1999", vol. 635 (2000), pp. 571.
12. Cronin, S.B., et al, Microscopy and Microanalysis, Vol. 8 (2002), pp. 58.
13. Vila, L. and Piraux, L., Appl. Phys. Lett., Vol. 80 (2002), pp. 3805.
14. Choi, S.H., et al, J. Vac. Sci. and Tech. A-Vacuum Surfaces and Films, Vol. 18 (2000), pp. 1326.
15. Cronin, S.B., et al, "Materials Research Society: Symposium Proceedings, Fall 2001", vol. 691 (2002), pp. G8.9.
16. Tans, S.J., et al, Nature, Vol. 393 (1998), pp. 49.
17. Koltonyuk, M. et al, Appl Phys. Lett., Vol. 74 (1999), pp. 555.
18. Odom, T.W., et al, Nature, Vol. 391 (1998), pp. 62.