Single-electron capacitance spectroscopy of vertical quantum dots using a single-electron transistor

Applied Physics Letters

Volumn 74, Issue 4, 1999, Pages 555-557

  Koltonyuk, M ^a   Berman, D ^a,c   Zhitenev, N B ^a,b   Ashoori, R C ^a   Pfeiffer, L N ^b   West, K W ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b NOKIA RESEARCH CENTER   (United States)

^c IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004026052     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123143     Document Type: Article

References (17)

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