Calculating the error in long term oxide reliability estimates

IEEE International Reliability Physics Symposium Proceedings

Volumn 2001-January, Issue , 2001, Pages 168-171

  Linder, B P ^a   Stathis, J H ^a   Frank, D J ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Circuit testing; Design for quality; Dielectrics; Electric breakdown; Integrated circuit reliability; Monte Carlo methods; MOSFETs; Stress; Uncertainty; Voltage

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; GATE DIELECTRICS; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS; MONTE CARLO METHODS; STRESSES;

CIRCUIT TESTING; DESIGN FOR QUALITIES; INTEGRATED CIRCUIT RELIABILITY; MOSFETS; UNCERTAINTY;

RELIABILITY;

EID: 84949790090     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2001.922897     Document Type: Conference Paper

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