An analysis of bipolar breakdown and its application to the design of ESD protection circuits

IEEE International Reliability Physics Symposium Proceedings

Volumn 2001-January, Issue , 2001, Pages 240-245

  Joshi, S ^a   Ida, R ^b   Givelin, P ^b   Rosenbaum, E ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b MOTOROLA INC   (United States)

Author keywords

Application software; BiCMOS integrated circuits; Breakdown voltage; Circuit synthesis; Diodes; Electric breakdown; Electrostatic discharge; Protection; Resistors; Space charge

Indexed keywords

APPLICATION PROGRAMS; DIODES; ELECTRIC BREAKDOWN; ELECTRIC GROUNDING; ELECTRIC SPACE CHARGE; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; INTEGRATED CIRCUIT MANUFACTURE; RESISTORS;

ANALYTICAL EXPRESSIONS; ANOMALOUS BEHAVIOR; BICMOS INTEGRATED CIRCUITS; CIRCUIT SYNTHESIS; ESD PROTECTION CIRCUIT; ITS APPLICATIONS; PROTECTION; PROTECTION CIRCUITS;

ELECTRIC NETWORK ANALYSIS;

EID: 84949784877     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2001.922908     Document Type: Conference Paper

References (6)

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