Characterization of layer thickness and interdiffusion in CdTe/CdS/ZTO/CTO solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 2000-January, Issue , 2000, Pages 525-528

  Levi, Dean ^a   Wu, Xuanzhi ^a   Swartzlander Guest, Amy ^a   Hasoon, Falah ^a   Matson, Rick ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CADMIUM TELLURIDE; CHARACTERIZATION; ELECTRON SPECTROSCOPY; OPTIMIZATION; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ELLIPSOMETRY;

AUGER ELECTRON SPECTROSCOPIES (AES); CHARACTERIZATION TECHNIQUES; DIFFUSION PROFILES; LAYER THICKNESS; MEASUREMENT TECHNIQUES; MEASUREMENTS OF; MULTILAYER STRUCTURES; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

SOLAR CELLS;

EID: 84949566545     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2000.915888     Document Type: Conference Paper

References (5)

1. D.H. Levi, H.R. Moutinho, F.A. Hasoon, B.M. Keyes, R.K. Ahrenkiel, M. Al-Jassim, L.L. Kazmerski, and R.W. Birkmire First IEEE WCPEC, 1994, pp. 127-131.
2. Wu, X.; Asher, S.; Levi, D.H.; King, D.E.; Yan, Y.; Gessert, T.A.; Sheldon, P., J. Appl. Phys., in press.
3. J. Britt and C. Ferekides, Appl. Phys. Lett., 62, pp. 2852, (1993).
4. nd Ed. 1988).
5. R.A. Synowicki, Thin Solid Films, 313(4), pp. 394, (1998).