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Volumn 2000-January, Issue , 2000, Pages 83-86
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Lifetime enhancement in EFG multicrystalline silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ANNEALING;
DEFECTS;
PASSIVATION;
ANNEALING TEMPERATURES;
DEFECT PASSIVATION;
EFG MULTI-CRYSTALLINE SILICONS;
HIGH TEMPERATURE;
LIFETIME ENHANCEMENT;
MANUFACTURABLE PROCESS;
MAXIMUM LIFETIMES;
OPTIMUM TEMPERATURE;
SILICON NITRIDE;
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EID: 84949544795
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2000.915758 Document Type: Conference Paper |
Times cited : (10)
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References (6)
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