Filter optimization for X-ray inspection of surface-mounted ICs

IEEE International Reliability Physics Symposium Proceedings

Volumn 2002-January, Issue , 2002, Pages 377-379

  Blish, R C ^a   Li, S X ^a   Lehtonen, D ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

Circuits; Filters; Inspection; Low voltage; Soldering; Tin; Wiring; X ray detection; X ray imaging; Zinc

Indexed keywords

ELECTRIC WIRING; FILTERS (FOR FLUIDS); INSPECTION; LEAD; NETWORKS (CIRCUITS); SHIPS; SILICON; SOLDERING; SURFACE MOUNT TECHNOLOGY; TIN; X RAY ANALYSIS; X RAY TUBES; ZINC;

CUMULATIVE DAMAGE; FILTER OPTIMIZATION; LOW VOLTAGES; ORDERS OF MAGNITUDE; THERMOLUMINESCENT DETECTORS; X-RAY DETECTIONS; X-RAY TUBE VOLTAGES; XRAY IMAGING;

PRINTED CIRCUIT BOARDS;

EID: 84949191280     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2002.996666     Document Type: Conference Paper

References (8)

1. http://www.usps.com/news/2001/press/pr01-093.htm, describes USPS plans, which shows Ion Beams Applications (IBA) as one supplier. Reference [2], an IBA URL shows how the USPS sterilization dose was chosen
2. http://www.ibatg.com/root-tg/pages/IBATG-electron-beam-acc.htm
3. http://nppp.jpl.nasa.gov/docs/Radcrs-Final5.pdf, from which the final two pages provide total dose thresholds for commercial semiconductor devices and citations [6-8]
4. R. Harboe-Sorenson et al., Heavy Ion, Proton and Co-60 Radiation Evaluation of 16 Mbit DRAM Memories for Space Application, IEEE Radiation Effects Data Workshop Record, 1995, p. 42
5. R. L. Pease, Total-Dose Issues for Microelectronics in Space Systems, IEEE Trans. Nucl. Sci. Vol. 43, No. 2, P. 442 (1996)
6. T. P. Ma and P. V. Dressendorfer, Ionizing Radiation Effects in MOS Devices and Circuits, New York, Wiley & Sons, 1989
7. P. V. Dressendorfer, Basic Mechanisms for the New Millennium, IEEE Press, NSREC Short Course, 1998
8. T. Oldham, Ionizing Radiation Effects in MOS Oxides, World Scientific, River Edge, NJ, 1999