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Volumn 75, Issue , 2016, Pages 155-161

β-NiS and Ni3S4 nanostructures: Fabrication and characterization

Author keywords

Electron microscopy; Nanostructures; Optical properties; Semiconductors; X ray diffraction

Indexed keywords

ELECTRON MICROSCOPY; ENERGY GAP; FOURIER TRANSFORM INFRARED SPECTROSCOPY; NANOPARTICLES; NICKEL; OPTICAL BAND GAPS; OPTICAL PROPERTIES; SEMICONDUCTOR MATERIALS; SODIUM; SODIUM COMPOUNDS; SPECTROSCOPIC ANALYSIS; SULFUR COMPOUNDS; THIOUREAS; X RAY DIFFRACTION;

EID: 84949008109     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2015.11.037     Document Type: Article
Times cited : (73)

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