Broadband measurement of ESD risetimes to distinguish between different discharge mechanisms

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 2001-January, Issue , 2001, Pages 371-382

  Bonisch, Sven ^a   Pommerenke, David ^b   Kalkner, Wilfried ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b HEWLETT PACKARD COMPANY   (United States)

Author keywords

Bandwidth; Charge carriers; Electric breakdown; Electrodes; Electrostatic discharge; Electrostatic measurements; Reproducibility of results; Scanning electron microscopy; Surface discharges; Voltage

Indexed keywords

BANDWIDTH; CHARGE CARRIERS; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; ELECTRODES; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; ELECTROSTATICS; LASER OPTICS; SCANNING ELECTRON MICROSCOPY; SURFACE DISCHARGES;

BROADBAND MEASUREMENTS; DISCHARGE MECHANISMS; ELECTRODE MATERIAL; ELECTRODE SURFACES; ELECTROSTATIC MEASUREMENTS; GAP DISTANCES; MEASUREMENT DATA; REPRODUCIBILITIES;

ELECTRIC DISCHARGES;

EID: 84948967462     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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