Experimental and theoretical consideration of physical design parameters in field-induced charged device model ESD simulators and their impact upon measured withstand voltages

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1998, Pages 40-53

  Carey, R E ^a   DeChiaro, L F ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; ELECTRIC DISCHARGES; ELECTROSTATICS; SIMULATORS;

ELECTROSTATIC DISCHARGES (ESD); FIELD INDUCED CHARGED DEVICE MODELS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0032312983     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)